5

Opening up closings—the Ecuadorian way

Year:
1997
Language:
english
File:
PDF, 3.07 MB
english, 1997
8

On the breakdown statistics of very thin SiO2 films

Year:
1990
Language:
english
File:
PDF, 865 KB
english, 1990
9

Rapport-building activities in corner shop interactions

Year:
2004
Language:
english
File:
PDF, 581 KB
english, 2004
10

Pragmatic Variation in Corner Store Interactions in Quito and Madrid

Year:
2005
Language:
english
File:
PDF, 2.34 MB
english, 2005
12

Am I Who I Say I Am? Social Identities and Identification

Year:
2010
Language:
english
File:
PDF, 1.76 MB
english, 2010
33

On the oxide interface micro-roughness in MOS devices

Year:
1989
Language:
english
File:
PDF, 342 KB
english, 1989
34

Breakdown of SiO2 films in VLSI MOS structures

Year:
1989
Language:
english
File:
PDF, 394 KB
english, 1989
35

Simple STM theory

Year:
1990
Language:
english
File:
PDF, 337 KB
english, 1990
40

On the SiSiO2 interface roughness in VLSIMOS structures

Year:
1988
Language:
english
File:
PDF, 894 KB
english, 1988
41

Degradation and Breakdown of Gate Oxides in VLSI Devices

Year:
1989
Language:
english
File:
PDF, 744 KB
english, 1989